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FULL DESCRIPTION of Item 254093

in Other Film Thickness Testers
Item ID: 254093

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KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool

KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool

  • Dual 300 mm Loadports
  • Wafer Level Reliability
  • Broadband Spectroscopic Ellipsometer
  • Single Wave Ellipsometer
  • Stress Measurement
  • iDesorber
 KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool
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Location: Austin, Texas, United States
Unit Price Unstated
Number of Units 1
Manufacturer KLA-Tencor
Model Aleris 8350
Description Advanced Film Metrology Tool
Wafer Size Range 
  Minimum 300 mm
  Maximum 300 mm
  Set Size 300 mm
Illumination Source Type Multi-wavelength Source
Multi-Layer Film Capacity YES
Micro Spot Optics YES
Scanning Stage YES
Wafer Mapping YES
Condition Excellent
Year of Manufacture 2016
Power Requirements 208/230 V     16.0 A     50/60 Hz     1 Phase