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FULL DESCRIPTION of Item 254100

in Other Metrology Equipment
Item ID: 254100

Offered 1 Offered at Best Price


KLA Altair 8935 AOI Tool

KLA Altair 8935 AOI Tool

  • For 150mm & 200mm Patterned & Unpatterned Wafers 
  • For GaN & GaAs on Sapphire & Silicon Wafers
  • Brightfield/Darkfield Optics
  • 2X, 5X, 10X & 20X Objectives
  • 35X LWD Review Capability
  • 0.2 um Max DF Sensitivity
  • Die to Die Detection Algorithm
  • Focus Tracking
  • RBB Defect Classification
  • 6.5 WPH Throughput
 KLA Altair 8935 AOI Tool
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Location: Austin, Texas, United States
Unit Price Unstated
Number of Units 1
Manufacturer KLA
Model Altair 8935
Description AOI Tool
CE Marked YES